TTTC's Electronic Broadcasting Service |
IEEE International Workshop on Defects, Adaptive Test and Data Analysis
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CALL FOR PAPERS AND PARTICIPATION
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It�s all about the DATA. Everything we do in Test relies on data. We use data to identify our good parts, our bad parts, and our weak parts We manipulate test data to detect outliers and reliability risks. We use data to control and adjust future testing. We also use data to record the full history of wafer lots and to track baseline production changes. And of course we have to collect all that data, store it, analyze it, secure it, and syndicate it to authorized consumers. The Organizing Committee for the DATA-2014 Workshop is soliciting papers in the area of semiconductor test data management, analysis, and syndication. Of particular interest are innovations and advancements in: application of �Big Data� analysis techniques to test data, semiconductor test data acquisition methods, data storage and retrieval, security and syndication, analysis methods including data mining, and implementation of adaptive test. Submissions from qualified data management parties outside the semiconductor industry are welcome. Preference will be given to real-world case studies. Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style �Spot-Light� presentations describing industrial experiences or research are also invited.
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To present at the workshop, send to JLRoehr@TI.com a PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format ) by August 15, 2014. Each submission should include full name and address of each author, affiliation, telephone number, FAX and Email address. Camera-ready papers for inclusion in the digest of papers will be due on Oct 8. |
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Submission Date: August 15, 2014 Notification of Acceptance: September 15, 2014 Camera Ready Paper (.pdf): Oct 3, 2014 Final Presentation Slides (.ppt): Oct 10, 2014
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Additional Information | |
Technical Program Submissions: Jeffrey Roehr Texas Instruments, USA. E-mail: JLRoehr@TI.com
General Information: Arani Sinha Intel, USA. E-mail: Arani.Sinha@INTEL.com
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Committee | |
GENERAL CHAIR
PROGRAM CHAIR
VICE-PROGRAM CHAIR
PANEL CHAIR
FINANCE CHAIR
PUBLICITY CHAIR
PUBLICATIONS CHAIR
TEST STANDARDS CHAIR
EU LIAISON
STEERING COMMITTEE
PROGRAM COMMITTEE
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For more information, visit us on the web at: http://DATA.tttc-events.org/ |
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The IEEE International Workshop on Defects, Adaptive Test and Data Analysis 2014 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society- Test Technology Technical Council |
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TTTC CHAIR
PAST CHAIR
TTTC 1ST VICE CHAIR
SECRETARY
ITC GENERAL CHAIR TEST WEEK COORDINATOR TUTORIALS AND EDUCATION STANDARDS EUROPE MIDDLE EAST & AFRICA STANDING COMMITTEES ELECTRONIC MEDIA |
PRESIDENT OF BOARD SENIOR PAST CHAIR TTTC 2ND VICE CHAIR FINANCE IEEE DESIGN & TEST EIC TECHNICAL MEETINGS TECHNICAL ACTIVITIES ASIA & PACIFIC LATIN AMERICA NORTH AMERICA COMMUNICATIONS INDUSTRY ADVISORY BOARD |